Up to 21 million pixels SWIR camera
A new pixel-shifting SWIR camera capable of high-resolution (5M, 12M, 21M) imaging and various inspection applications has arrived!
By conducting inspections at a maximum resolution of 21M and SWIR wavelengths, we capture defects that are typically undetectable, contributing to the efficiency of production. 【Examples of SWIR Camera Utilization】 - In wafer inspections, scratches that are invisible under visible light are detected. - Through-holes in substrates can be highlighted, simplifying the inspection of hole positions and sizes. - Objects that appear the same color under visible light are reflected in different colors under SWIR wavelengths due to differences in moisture permeability, allowing for differentiation of materials and contents. - Depending on the type of liquid, light is absorbed or transmitted, enabling the determination of the presence and quantity of contents, as well as the mixing of foreign substances. - Contents can be confirmed by penetrating bottle labels and plastic candy bags. - Leaf veins and bruises on fruits become more pronounced, making them effective for freshness checks and quality inspections. Previously, we offered the SXGA resolution "VCC-SXCXP1SW," but we are now introducing the new high-resolution pixel-shift SWIR camera "VCC-SXCXP1SWPS" with a maximum resolution of 21M. The camera is equipped with an actuator incorporating our proprietary piezoelectric elements, enabling even higher precision imaging.
- 企業：シーアイエス
- 価格：Other
